Measuring Strain Fields surrounding Grain-Boundary...

Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

Couillard, Martin
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006965
Date:
August, 2014
File:
PDF, 1.58 MB
english, 2014
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