![](/img/cover-not-exists.png)
Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy
Couillard, MartinVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006965
Date:
August, 2014
File:
PDF, 1.58 MB
english, 2014