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Statistical Characterization of High Angle Graphene Grain Boundaries at Atomic Resolution
Ophus, Colin, Rasool, Haider, Zettl, Alex, Crommie, Michael F, Dahmen, UlrichVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614007004
Date:
August, 2014
File:
PDF, 3.13 MB
english, 2014