Atomic Imaging Across Strain Boundaries in Bilayer Graphene...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM

Hovden, Robert, Alden, Jonathan, Tsen, Adam W., Huang, Pinshane Y., Brown, Lola, Park, Jiwoong, McEuen, Paul L., Muller, David A.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614007016
Date:
August, 2014
File:
PDF, 2.74 MB
english, 2014
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