An Electron Microscopic Investigation of (1/3) Dislocations...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

An Electron Microscopic Investigation of (1/3) Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects.

Medlin, D.L., Erickson, K.J., Limmer, S.J., Yelton, W.G., Siegal, M.P.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614007168
Date:
August, 2014
File:
PDF, 3.62 MB
english, 2014
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