Secondary Electron Imaging in the Helium Ion Microscope

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Secondary Electron Imaging in the Helium Ion Microscope

Matola, Brad, Joy, David C
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614007223
Date:
August, 2014
File:
PDF, 554 KB
english, 2014
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