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New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System
Jiruše, Jaroslav, Havelka, Miloslav, Haničinec, Martin, Polster, Jan, Hrnčíř, TomášVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614007247
Date:
August, 2014
File:
PDF, 1.37 MB
english, 2014