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Measurement of Detection Efficiency in Atom Probe Tomography
Prosa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614007533
Date:
August, 2014
File:
PDF, 2.06 MB
english, 2014