Evidence for Active Atomic Defects in Monolayer Hexagonal Boron Nitride
Cretu, Ovidiu, Lin, Yung-Chang, Suenaga, KazutomoVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761401037x
Date:
August, 2014
File:
PDF, 1.41 MB
english, 2014