Atom-by-Atom STEM Investigation of Defect Engineering in Graphene
Ramasse, Q.M., Kepapstoglou, D.M., Hage, F.S., Susi, T., Kotakoski, J., Mangler, C., Ayala, P., Meyer, J., Hinks, J.A., Donnelly, S., Zan, R., Pan, C.T., Haigh, S.J., Bangert, U.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614010411
Date:
August, 2014
File:
PDF, 1.23 MB
english, 2014