Optical Spectroscopy Integrated with Environmental Scanning Transmission Electron Microscope: A Comprehensive In Situ Characterization Platform
Picher, Matthieu, Mazzucco, Stefano, Blankenship, Steve, Holland, Glenn, Sharma, RenuVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614010472
Date:
August, 2014
File:
PDF, 1.73 MB
english, 2014