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Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM
Wu, Ryan J., Odlyzko, Michael L., Andre Mkhoyan, K.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761401071x
Date:
August, 2014
File:
PDF, 1.79 MB
english, 2014