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Use of Secondary Ions Mass Spectrometry (SIMS) for Cladding Materials Post-Irradiation Examination (PIE)
Portier, S., Mine, N., Martin, M.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614010745
Date:
August, 2014
File:
PDF, 16.64 MB
english, 2014