The Focused Ion Beam-SEM as a Critical Tool For Nano-scale...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

The Focused Ion Beam-SEM as a Critical Tool For Nano-scale Characterization of Highly Radioactive Nuclear Fuels

Cole, James I., Aitkaliyeva, Assel, Madden, James W., Miller, Brandon D.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614010770
Date:
August, 2014
File:
PDF, 1.13 MB
english, 2014
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