Nanocharacterization and Electrical Properties of Grain Boundaries in Gd/Pr Doubly-Doped Ceria
Bowman, W. J., Zhu, J., Crozier, P. A.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614011209
Date:
August, 2014
File:
PDF, 1.71 MB
english, 2014