Sensitivity of an Atomic Force Microscope Cantilever with a...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Sensitivity of an Atomic Force Microscope Cantilever with a Crack

Lee, Haw-Long, Yang, Yu-Ching, Chang, Win-Jin
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Volume:
20
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761401143x
Date:
August, 2014
File:
PDF, 891 KB
2014
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