Multimodal Chemical and Physical Surface Characterization on a Combined AFM-MS Platform.
Ovchinnikova, Olga S., Van Berkel, Gary J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614012124
Date:
August, 2014
File:
PDF, 1.06 MB
english, 2014