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Elemental Quantification and Visualization of GaN Structures using APT and SIMS
Giddings, A. D., Prosa, T. J., Merkulov, A., Stevie, F. A., Francois-Saint-Cyr, H. G., Young, N. G., Speck, J. S., Larson, D. J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761401229x
Date:
August, 2014
File:
PDF, 1.08 MB
english, 2014