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Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy
Meyer, Jannik C., Kotakoski, Jani, Argentero, Giacomo, Mangier, Clemens, Bayer, Bernhard, Kramberger-Kaplan, Christian, Eder, Franz, Hummel, Stefan, Elibol, Kenan, Mittelberger, AndreasVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615006522
Date:
August, 2015
File:
PDF, 2.40 MB
english, 2015