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Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design
Jones, Lewys, MacArthur, Katherine E., Aarons, Jolyon, Skylaris, Chris-Kriton, Sarwar, Misbah, Ozkaya, Dogan, Nellist, Peter D.Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615011769
Date:
August, 2015
File:
PDF, 437 KB
english, 2015