Enhanced Detection Sensitivity with a New Windowless XEDS...

Microscopy Today 2010 / 7 Vol. 18; Iss. 4

Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology

Schlossmacher, P., Klenov, D.O., Freitag, B., von Harrach, H.S.
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Volume:
18
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929510000404
Date:
July, 2010
File:
PDF, 6.99 MB
english, 2010
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