Application of X-ray Photoelectron Spectroscopy (XPS) for...

Microscopy Today 2011 / 3 Vol. 19; Iss. 2

Application of X-ray Photoelectron Spectroscopy (XPS) for the Surface Characterization of Gunshot Residue (GSR)

Schwoeble, A. J. “Skip”, Strohmeier, Brian R., Bunker, Kristin L., McAllister, Darlene R., Marquis, James P., Piasecki, John D., McAllister, Nikki M.
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Volume:
19
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929511000113
Date:
March, 2011
File:
PDF, 1.21 MB
english, 2011
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