Precision Local Electrical Probing: Potential for the...

Microscopy Today 2013 / 3 Vol. 21; Iss. 2

Precision Local Electrical Probing: Potential for the Analysis of Nanocontacts and Nanointerconnects

Guenther, B., Koeble, J., Chrost, J., Maier, M., Schneider, C. M., Bettac, A., Feltz, A.
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Volume:
21
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929513000084
Date:
March, 2013
File:
PDF, 1.31 MB
english, 2013
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