Quantitative Analysis and High-Resolution X-ray Mapping...

Quantitative Analysis and High-Resolution X-ray Mapping with a Field Emission Electron Microprobe

Hombourger, C., Outrequin, M.
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Volume:
21
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929513000515
Date:
May, 2013
File:
PDF, 1.60 MB
english, 2013
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