Fabrication of a Novel Rotating Sample Holder to Eliminate the “Curtaining Effect” in FIB-Prepared TEM Specimens
Wang, Nathan, Perreault, GeorgeVolume:
22
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929514001151
Date:
November, 2014
File:
PDF, 1.35 MB
english, 2014