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Electron microscopic characterization of diamond films grown on Si by bias-controlled chemical vapor deposition
Ma, G-H.M., Lee, Y. H., Glass, J. T.Volume:
5
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.1990.2367
Date:
November, 1990
File:
PDF, 7.43 MB
english, 1990