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Analysis of resistance switching and conductive filaments inside Cu-Ge-S using in situ transmission electron microscopy
Fujii, Takashi, Arita, Masashi, Takahashi, Yasuo, Fujiwara, IchiroVolume:
27
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2011.437
Date:
March, 2012
File:
PDF, 788 KB
english, 2012