Using High Frequency LIMM to characterize the poling state...

Using High Frequency LIMM to characterize the poling state of piezoelectric ceramic thin films

Stewart, Mark, Cain, Markys G
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Volume:
1805
Year:
2015
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2015.696
File:
PDF, 12.97 MB
english, 2015
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