X-Ray Diffraction Study of a Thin GaAs Film on Si(100)

MRS Proceedings 1987 / 1 Vol. 102

X-Ray Diffraction Study of a Thin GaAs Film on Si(100)

Bommannavar, Arun S., Sparks, C. J., Habenschuss, A., Ice, G. E., Dhere, A., Morkoc, H., Zabel, H.
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Volume:
102
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-102-223
Date:
January, 1987
File:
PDF, 633 KB
english, 1987
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