Characterisation of Ultrafine Microstructures Using a...

MRS Proceedings 1988 / 1 Vol. 132

Characterisation of Ultrafine Microstructures Using a Position-Sensitive Atom Probe (POSAP)

Cerezo, Alfred, Grovenor, Chris R. M., Hetherington, Mark G., Shollock, Barbara A., Smith, George D. W.
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Volume:
132
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-132-155
Date:
January, 1988
File:
PDF, 831 KB
english, 1988
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