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Strain-Induced Lateral Confinement of Carriers in Semiconductor Quantum Wells
Kash, K., Bhat, R., Mahoney, Derek D., Worlock, J.M., Lin, P.S.D., Scherer, A., Van Der Gaag, B.P., Koza, M., Grabbe, P.Volume:
144
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-144-245
Date:
January, 1988
File:
PDF, 547 KB
english, 1988