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Dislocation Behaviour in GexSi1-x Epilayers on (001)Si
Kvam, Eric P., Maher, D.M., Humphreys, C.J.Volume:
160
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-160-71
Date:
January, 1989
File:
PDF, 1.50 MB
english, 1989