A Hvem Study of the Electron Irradiated Defects in Nitrogen Doped FZ-Si Single Crystal
Yuzun, Gao, Takeyama, T.Volume:
163
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-163-937
Date:
January, 1989
File:
PDF, 631 KB
english, 1989