A Hvem Study of the Electron Irradiated Defects in Nitrogen...

A Hvem Study of the Electron Irradiated Defects in Nitrogen Doped FZ-Si Single Crystal

Yuzun, Gao, Takeyama, T.
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Volume:
163
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-163-937
Date:
January, 1989
File:
PDF, 631 KB
english, 1989
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