Morphology and Defect Structure of Sputtered High-Quality...

MRS Proceedings 1990 / 1 Vol. 183

Morphology and Defect Structure of Sputtered High-Quality In-Situ YBa2Cu3O7−δ Films

Streiffer, S. K., Lairson, B. M., Eom, C. B., Marshallt, A. F., Bravman, J. C., Geballe, T. H.
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Volume:
183
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-183-363
Date:
January, 1990
File:
PDF, 3.58 MB
english, 1990
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