Microstructure Characterization of Ferroelectric Thin Films...

MRS Proceedings 1990 / 1 Vol. 200

Microstructure Characterization of Ferroelectric Thin Films used in Non-Volatile Memories - Optical and Scanning Electron Microscopy

Chapin, Leo N., Myers, Sharon A.
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Volume:
200
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-200-153
Date:
January, 1990
File:
PDF, 3.58 MB
english, 1990
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