Microstructural Characterization of Ferroelectric Thin...

MRS Proceedings 1990 / 1 Vol. 200

Microstructural Characterization of Ferroelectric Thin Films for Non-Volatile Memory Applications

Myers, Sharon A., Chapin, Leo N.
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Volume:
200
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-200-231
Date:
January, 1990
File:
PDF, 4.54 MB
english, 1990
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