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Quantitative Studies on the Evolution of the...

Quantitative Studies on the Evolution of the Polysilicon/Silicon Interfacial Oxide Upon Annealing

Ajuria, Sergio A., Reif, Rafael
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Volume:
202
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-202-107
Date:
January, 1990
File:
PDF, 1.20 MB
english, 1990
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