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Surface Analysis During the Growth of Ge and GexSi1−x Alloys on Si by Reflection Electron Energy Loss Spectrometry
Ahn, Channing C., Nikzad, Shouleh, Atwater, Harry A.Volume:
208
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-208-251
Date:
January, 1990
File:
PDF, 484 KB
english, 1990