Surface Analysis During the Growth of Ge and GexSi1−x...

Surface Analysis During the Growth of Ge and GexSi1−x Alloys on Si by Reflection Electron Energy Loss Spectrometry

Ahn, Channing C., Nikzad, Shouleh, Atwater, Harry A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
208
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-208-251
Date:
January, 1990
File:
PDF, 484 KB
english, 1990
Conversion to is in progress
Conversion to is failed