The Distribution of Occupied Deep Levels in a-Si:H...

The Distribution of Occupied Deep Levels in a-Si:H Determined from CPM Spectra

Hata, Nobuhiro, Wagner, Sigurd
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Volume:
219
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-219-611
Date:
January, 1991
File:
PDF, 478 KB
english, 1991
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