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A-Si:H Ambipolar Diffusion Length and Effective Lifetime Measured by Flying Spot Technique (FST)
Vieira, M., Martins, R., Fortunato, E., Soares, F., Guimaraes, L.Volume:
219
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-219-863
Date:
January, 1991
File:
PDF, 255 KB
english, 1991