Void Growth as a Function of Residual Stress Level in Thin, Narrow Aluminum Lines
Korhonen, M.A., Børgesen, P., Paszkiet, C.A., Lee, J.K., Li, Che-YuVolume:
226
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-226-413
Date:
January, 1991
File:
PDF, 321 KB
english, 1991