Precision Ion Milling of Layered, Multi-Element TEM...

MRS Proceedings 1991 / 1 Vol. 254

Precision Ion Milling of Layered, Multi-Element TEM Specimens with High Specimen Preparation Spatial Resolution

Anderson, Ron, Benedict, John
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Volume:
254
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-254-141
Date:
January, 1991
File:
PDF, 5.23 MB
english, 1991
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