Comparison of Electron Beam-Induced and Light-Induced Defect Saturation in a-Si:H
Grimbergen, M., Lopez-Otero, A., Fahrenbruch, A., Benatar, L., Redfield, D., Bube, R., McConville, R.Volume:
258
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-258-443
Date:
January, 1992
File:
PDF, 448 KB
english, 1992