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Device Degradation on a Full-Frame CCD Image Sensor with a Transparent Gate Electrode
Hseih, Biay-Cheng, Kosman, S., Lo, Y.C., Jayakar, K., Mehra, M., Roselle, P., Chang, W. C.Volume:
262
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-262-803
Date:
January, 1992
File:
PDF, 394 KB
english, 1992