Hardness and Modulus Studies on Dielectric Thin Films

Hardness and Modulus Studies on Dielectric Thin Films

Chiang, Chien, Neubauer, Gabi, Mack, Anne Sauter, Yoshioka, Ken, Cuan, George, Flinn, Paul A., Fraser, David B.
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Volume:
265
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-265-219
Date:
January, 1992
File:
PDF, 1.95 MB
english, 1992
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