Effects of X-ray Irradiation on MOSFET Characteristics and...

MRS Proceedings 1992 / 1 Vol. 265

Effects of X-ray Irradiation on MOSFET Characteristics and DRAM Leakage Phenomena

Kasi, Srinandan R., Voldman, Steven H.
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Volume:
265
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-265-243
Date:
January, 1992
File:
PDF, 352 KB
english, 1992
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