Stability and Relaxation of Point Defects in amorphous...

Stability and Relaxation of Point Defects in amorphous silicon

Lutz, Raymond, Lewis, Laurent J.
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Volume:
279
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-279-189
Date:
January, 1992
File:
PDF, 416 KB
english, 1992
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