Microstructural Characterization of Low Temperature...

MRS Proceedings 1992 / 1 Vol. 280

Microstructural Characterization of Low Temperature GaAs(111)B MBE Growth by AFM and Tem

de Boer, M. P., Angelo, J. E., Dabiran, A. M., Cohen, P. I., Gerberich, W. W.

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Volume:

280

Language:

english

Journal:

MRS Proceedings

DOI:

10.1557/proc-280-631

Date:

January, 1992

File:

PDF, 2.53 MB

english, 1992

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