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Microstructural Characterization of Low Temperature GaAs(111)B MBE Growth by AFM and Tem
de Boer, M. P., Angelo, J. E., Dabiran, A. M., Cohen, P. I., Gerberich, W. W.Volume:
280
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-280-631
Date:
January, 1992
File:
PDF, 2.53 MB
english, 1992