Characterization of Porous Silicon: Structural, Optical and...

MRS Proceedings 1992 / 1 Vol. 283

Characterization of Porous Silicon: Structural, Optical and Electrical Properties

Badoz, P. A., Bensahel, D., Bomchil, G., Ferrieu, F., Halimaoui, A., Perret, P., Regolini, J. L., Sagnes, I., Vincent, G.
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Volume:
283
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-283-97
Date:
January, 1992
File:
PDF, 803 KB
english, 1992
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