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Variations in the Photoluminescence Intensity of Chemically and Anodically Etched Silicon Films
Williams, P.S, Kidder, J.N., Yun, H., Crain, D., Pearsall, T.P.Volume:
298
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-298-313
Date:
January, 1993
File:
PDF, 1.64 MB
english, 1993