Mapping of Defects in Metal-Semiconductor-Metal (MSM)...

Mapping of Defects in Metal-Semiconductor-Metal (MSM) Detectors in Hg1−xCdxTe by Nuclear Microprobe

Leech, Patrick W., Dooley, Sean P., Jamieson, David N.
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Volume:
299
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-299-163
Date:
January, 1994
File:
PDF, 1.68 MB
english, 1994
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